Probe calibrating substrate for electronic application, has two conductive units interconnected with two respective ground paths of probes, where resistive material extends certain percentage of distance between units

摘要

The substrate has two conductive units (160, 162) supported by the substrate to be interconnected with two respective signal paths of a probe. A conductive unit (164) is supported by the substrate to be interconnected with a ground path of the probe. A last conductive unit is interconnected with a ground path of another probe. A resistive material extends 50 percentage of distance between the unit (164) and the last unit.