发明名称 |
METHOD FOR MANUFACTURING SiC SINGLE CRYSTAL SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for manufacturing a silicon carbide single crystal substrate which exhibits no zone affected by surface treatment or residue or surface roughness caused by the removal of ion damage and has a surface exhibiting a high degree of cleanness and flatness. SOLUTION: The method for manufacturing the silicon carbide single crystal substrate has a process for removing zones affected by treatment on the surface of the silicon carbide single crystal substrate by etching by using reactive gas excluding fluorine base gas. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2006261563(A) |
申请公布日期 |
2006.09.28 |
申请号 |
JP20050079818 |
申请日期 |
2005.03.18 |
申请人 |
NIPPON STEEL CORP |
发明人 |
AIGO TAKASHI;FUJIMOTO TATSUO;KATSUNO MASAKAZU;SAWAMURA MITSURU;TSUGE HIROSHI;NAKABAYASHI MASASHI;YASHIRO HIROKATSU;OTANI NOBORU |
分类号 |
H01L21/3065;C30B29/36;C30B33/12 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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地址 |
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