发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
<p>A semiconductor device includes a plurality of MOS transistors (12), each including a gate electrode (20) formed on a semiconductor substrate (10) via a gate insulation film (18), a source diffusion layer (28) and a drain diffusion layer (34) of the second conductive type formed at both sides of the gate electrode (20) in the semiconductor substrate (10) and arranged to sandwich a channel region (36) of the first conductive type. The source diffusion layers (28) and the drain diffusion layers (34) of the MIS transistors (12) are arranged in the same direction. A pocket region of the first conductive type is selectively formed between the source diffusion layers (28) and the channel regions (36) of the respective MIS transistors (12). A pocket non-implanted region is formed between the drain diffusion layers (34) and the channel regions (36) of the respective MIS transistors (12).</p> |
申请公布号 |
WO2006101068(A1) |
申请公布日期 |
2006.09.28 |
申请号 |
WO2006JP305522 |
申请日期 |
2006.03.20 |
申请人 |
KUDO, HIROSHI;FUJITSU LIMITED |
发明人 |
KUDO, HIROSHI |
分类号 |
H01L27/088;H01L21/8234;H01L21/8244;H01L27/10;H01L27/11 |
主分类号 |
H01L27/088 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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