发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <p>A semiconductor device includes a plurality of MOS transistors (12), each including a gate electrode (20) formed on a semiconductor substrate (10) via a gate insulation film (18), a source diffusion layer (28) and a drain diffusion layer (34) of the second conductive type formed at both sides of the gate electrode (20) in the semiconductor substrate (10) and arranged to sandwich a channel region (36) of the first conductive type. The source diffusion layers (28) and the drain diffusion layers (34) of the MIS transistors (12) are arranged in the same direction. A pocket region of the first conductive type is selectively formed between the source diffusion layers (28) and the channel regions (36) of the respective MIS transistors (12). A pocket non-implanted region is formed between the drain diffusion layers (34) and the channel regions (36) of the respective MIS transistors (12).</p>
申请公布号 WO2006101068(A1) 申请公布日期 2006.09.28
申请号 WO2006JP305522 申请日期 2006.03.20
申请人 KUDO, HIROSHI;FUJITSU LIMITED 发明人 KUDO, HIROSHI
分类号 H01L27/088;H01L21/8234;H01L21/8244;H01L27/10;H01L27/11 主分类号 H01L27/088
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