发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 <p>After forming a ferroelectric film and an upper electrode film on a lower electrode film (9), an upper electrode (11a) is formed by patterning the upper electrode film. Then, a capacitor insulating film (10a) is formed by performing ferroelectric film patterning, including over etching. At this time, a surface layer part of the lower electrode film (9) is etched by over etching, particles and the like scattered from the surface layer part adhere on the side part and the like of the capacitor insulating film (10a), and a layer (51) having conductivity is formed. Then, the layer (51) is removed by performing etch-back to the entire plane by plasma etching and the like. The etch-back is performed with a low power in a short time.</p>
申请公布号 WO2006100737(A1) 申请公布日期 2006.09.28
申请号 WO2005JP05020 申请日期 2005.03.18
申请人 FUJITSU LIMITED;SUEZAWA, KENKICHI 发明人 SUEZAWA, KENKICHI
分类号 H01L21/8239;H01L27/105 主分类号 H01L21/8239
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