发明名称 |
SILICON CARBIDE SEMICONDUCTOR, ITS MANUFACTURING METHOD AND MANUFACTURING APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide a silicon carbide semiconductor doped with impurity nitrogen at high accuracy uniformly in the plane and having wide area. SOLUTION: A silicon carbide semiconductor manufacturing method uses epitaxial growth to grow the crystal of silicon carbide and dopes the inside of it with nitrogen. The silicon carbide semiconductor manufacturing method has a pre-heating step for performing thermal decomposition in advance, before introducing the gas of a nitrogen compound supplied as a nitrogen source onto a substrate where the crystal of silicon carbide is formed. The silicon carbide semiconductor manufacturing method has the pre-heating step allowing the gas of the nitrogen compound to flow inside a chamber at 1,300°C or higher. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2006261612(A) |
申请公布日期 |
2006.09.28 |
申请号 |
JP20050080648 |
申请日期 |
2005.03.18 |
申请人 |
SHIKUSUON:KK;KANSAI ELECTRIC POWER CO INC:THE;SUMITOMO ELECTRIC IND LTD;MITSUBISHI CORP |
发明人 |
NISHIGUCHI TARO;HARADA MAKOTO;KINOSHITA HIROYUKI;SHIOMI HIROSHI |
分类号 |
H01L21/205;C23C16/42;C30B29/36;H01L29/167 |
主分类号 |
H01L21/205 |
代理机构 |
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