发明名称 SEMICONDUCTOR CAPACITOR
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor capacitor wherein the deterioration of a breakdown voltage yield and the deterioration of the life of an insulating film can be prevented. SOLUTION: In the semiconductor capacitor 1, the plan layout of a trench 5 is made to be an annular square closed loop without an open end. Consequently, a stress concentration etc. to a trench structure is alleviated upon the formation of the trench 5, and the occurrence of a crystal defect in the semiconductor substrate 2 can be prevented. Thus, the deterioration of the breakdown voltage yield of the insulating film 6 formed on a semiconductor substrate 2 can be prevented, and the deterioration of the life of the insulating film 6 can be prevented in the semiconductor capacitor 1. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006261416(A) 申请公布日期 2006.09.28
申请号 JP20050077278 申请日期 2005.03.17
申请人 DENSO CORP 发明人 KITAMURA YASUHIRO
分类号 H01L27/04;H01L21/02;H01L21/76;H01L21/762;H01L21/822;H01L27/12 主分类号 H01L27/04
代理机构 代理人
主权项
地址