| 摘要 |
PROBLEM TO BE SOLVED: To make an efficient crossing detection in a wire crossing detection program and a wire crossing detection method for detecting a wire crossing in a layout on a semiconductor device. SOLUTION: For crossing detection between first and second wires substantially from the center to the periphery, with the start point of the first wire as the origin, the abscissa and ordinate of the end point of the first wire and the abscissas and ordinates of the start point and end point of the second wire are acquired, a first Manhattan line comprising a divergence and a segment corresponding to the first wire is produced from the abscissa and ordinate of the end point of the first wire, and a second Manhattan line corresponding to the second wire is produced similarly from the abscissas and ordinates of the start point and end point of the second wire. If the first Manhattan line and the second Manhattan line do not cross, the first wire and the second wire are considered to be routed without a crossing, or if they cross, the first wire and the second wire are considered to be probably routed with a crossing. COPYRIGHT: (C)2006,JPO&NCIPI
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