| 摘要 |
PROBLEM TO BE SOLVED: To solve a problem wherein it is difficult to test the path between a random logic circuit and an exclusive macro, in the random logic circuit having a computing unit and a circuit mixedly having the exclusive macro such as a memory. SOLUTION: An SRAM 90 of scan test non-corresponding type receives an output of a multiplier 66. Circuits 62, 64, 70, 76, 84 and 86 for test transfer to test mode based on a predetermined command. When the transfer to the test mode is commanded, data provided to the multiplier 66 is switched to data for test, and an output value of the SRAM 90 is compared with a predetermined expected value. COPYRIGHT: (C)2006,JPO&NCIPI
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