| 摘要 |
A circuit automatic generation apparatus includes storage means 4 for retaining input/output information of each function circuit and circuit information to which the function circuit is connected, test mode generation specifications for generating a test mode signal, test specifications added to the function circuit, terminal test specifications for specifying the input/output directions of terminals and circuit terminal information to which the terminals are connected, and input/output information of a top-layer circuit and circuit information to which the top-layer circuit is connected; connection information check means 5 for determining the presence or absence of a connection defect of the function circuit; test mode generation circuit generation means 10 for generating a test mode generation circuit; test specification addition function circuit generation means 9 for generating a function circuit to which test specifications are added; terminal test circuit generation means 11 for generating a terminal test circuit; and top-layer circuit generation means 8 for generating the top-layer circuit from the test mode generation specifications, the terminal test specifications, the input/output information of the function circuit and circuit information to which the function circuit is connected, the test specifications added to the function circuit, and the input/output information of the top-layer circuit and circuit information to which the top-layer circuit is connected.
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