发明名称 Semiconductor integrated circuit device, debug system, microcomputer, and electronic apparatus
摘要 An integrated circuit device including an internal debug module for on-chip debugging while communicating with a pin-saving debug tool and a CPU, the integrated circuit device comprises; a first debug terminal coupled to a first communication line; a first common control unit that controls using the first communication line for both transmission of a serial data signal corresponding debug data for sending, which is sent and/or received to and/or from the pin-saving debug tool during on-chip debugging and transmission of a run/break state signal, which shows a run state or a break state of the CPU.
申请公布号 US2006218445(A1) 申请公布日期 2006.09.28
申请号 US20060358843 申请日期 2006.02.20
申请人 SEIKO EPSON CORPORATION 发明人 KUDO MAKOTO
分类号 G06F11/00 主分类号 G06F11/00
代理机构 代理人
主权项
地址