发明名称 SYSTEM FOR TESTING OPTICAL DEVICE AND METHOD FOR MANUFACTURING OPTICAL DEVICE USING SAME
摘要 PROBLEM TO BE SOLVED: To provide a system for testing optical devices and capable of measuring and testing even optical devices in which contact surfaces of external connection terminals and the emergent direction of light emission are located in the same plane. SOLUTION: The system for testing optical devices includes a light reception element 14 for measuring optical output of optical devices; a socket 20 comprising both a socket base 11 for mounting an optical device and having terminals 13 to be in contact with external connection terminals and a lid part 12; an optical filter 15 mounted between an optical deice and the light reception element 14; and a first board 10 to which the socket 20 is mounted. The socket base 11 has a through hole 21 for the passage of light emergent from the optical device, and the optical filter 15 is held at a midpoint in the through hole 21. The light reception element 14 is mounted on the upper surface of the first board 10 at a location corresponding to the through hole 21 of the socket 20. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006258421(A) 申请公布日期 2006.09.28
申请号 JP20050072120 申请日期 2005.03.15
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 HAYAMIZU ISAO;NISHIKAWA TORU;TACHIYANAGI MASAYA;TANAKA SHOICHI
分类号 G01R31/26 主分类号 G01R31/26
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