THERMAL SWITCH WITH SELF-TEST FEATURE

摘要

A normally open thermal switch (200) having a bimetallic disk (18) is configured for operational testing in its installed position when exposed to a changing temperature by a test box (400) having a power source (400a). The in-place testing advantageously confirms triggering action of the switch by an event indicator (400c) at the operational temperatures designed into the switch (200). The temperature of the triggering action is presented on a temperature display (400b) and recorded by a data recorder (400d) of the test box (400). The switch (200) incorporates a heating element (24c) to heat changing the bimetallic disk (18) to snap activate at the operative temperatures. The thermal switch (200) is coupled with the test box (400) to confirm its operation without having to remove the switch from its installed location.