发明名称 PROBE CARD OF VERTICALLY BUFFERING TYPE
摘要 A vertical buffer type probe card is provided to prevent the damage of a pad of a semiconductor chip by using an improved buffering mechanism. A vertical buffer type probe card includes a reinforcing plate(101) with a plurality of holes; a PCB(Printed Circuit Board)(100) under the reinforcing plate; a ceramic structure(104) under the PCB; a planarization controlling unit(103) for aligning the reinforcing plate, PCB, and ceramic structure with each other; a vertical probe vertically inserted into the ceramic structure from the PCB; a ceramic disc; an aligning rod. The ceramic disc(106) is installed under the ceramic structure. The ceramic disc includes a plurality of holes. The aligning rod(105) is used for connecting vertically the PCB with the ceramic structure.
申请公布号 KR100632484(B1) 申请公布日期 2006.09.28
申请号 KR20060023546 申请日期 2006.03.14
申请人 MAX QUEEN TRONIC CO., LTD. 发明人 LEE, GIL MAN;CHIO, KI SUN;YANG, HYUN JUNG;LIM, KI HYUN;KWAK, HYUNG JUNG;HAM, HYUNG WOOK
分类号 H01L21/66 主分类号 H01L21/66
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