| 摘要 |
A system and method for effectuating a self-timed clock (STC) loop for memory access operations wherein an Embedded Test and Repair (ETR) processor engine is utilized for optimizing an access margin value. Upon compiling a semiconductor memory instance based on its configuration data, a default access margin value is passed to a wrapper interface associated with the memory instance. In one implementation, an adjusted access margin value is determined by an optimization algorithm operable to be executed on the ETR processor engine, which adjusted access margin value is used for generating the STC signal with a particular time setting that is optimized for a memory instance of a given size.
|
