发明名称 X-ray imaging apparatus and method with an X-ray interferometer
摘要 An imaging apparatus and methods for using the same based upon the interposing of a sample in an X-ray interferometer, such as a Bonse-Hart interferometer. An incident X-ray is split, reflected and combined to form first and second interference beams. When a sample is placed in an optical path of one of the beams, the X-ray intensity, phase and transmission direction of the X-ray beam are altered. A change in the amplitude and phase of the interference beams caused by the sample are obtained using a fringe scanning method, and a detector is used to detect the resulting image.
申请公布号 US7113564(B2) 申请公布日期 2006.09.26
申请号 US20040929781 申请日期 2004.08.31
申请人 HITACHI, LTD. 发明人 YONEYAMA AKIO
分类号 G01N23/04;G21K1/06;A61B6/00;G01T1/00;G03H5/00 主分类号 G01N23/04
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