| 摘要 |
A system and method for use in obtaining precise positional information relating to one or more points. The points may comprise key locations on a large structure allowing for the geometry of the structure to be assessed based on the positional information. In one embodiment, a high accuracy angular resolution and measurement system includes a laser beam source ( 110 ), a bi-directional acousto-optic modulator ( 112 ), and an optical detector ( 104 ). The position of the optical detector ( 104 ) is determinable from deflection angles ( 120, 122 ) of the laser beam ( 106 ) when the laser beam ( 106 ) is deflected by the bi-directional acousto-optic modulator ( 112 ) in a direction corresponding to one of a plurality of illumination locations ( 140 ) coinciding with the position of the optical detector ( 104 ) within an illumination region ( 142 ) defined by the illumination locations ( 140 ).
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