发明名称 Semiconductor device having a merged region and method of fabrication
摘要 A semiconductor device includes an insulated gate electrode pattern formed on a well region. The semiconductor device further includes a sidewall spacer formed on sidewalls of the gate electrode pattern. A source region and a drain region are formed adjacent opposite sides of the gate pattern. In accordance with one embodiment of the present invention, one of the source or drain regions includes a first-concentration impurity region formed under the sidewall spacer. The semiconductor device further includes a silicide layer formed within the well region wherein at least a part of the silicide layer contacts a portion of the well region to bias the well region. A method of manufacturing the semiconductor device is also provided.
申请公布号 US7112856(B2) 申请公布日期 2006.09.26
申请号 US20020194181 申请日期 2002.07.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO KANG-SIK;KIM GYU-CHUL;CHO HOO-SUNG
分类号 H01L21/28;H01L29/76;H01L21/285;H01L21/336;H01L21/74;H01L21/8234;H01L21/8238;H01L27/088;H01L27/092;H01L29/417;H01L29/78 主分类号 H01L21/28
代理机构 代理人
主权项
地址