发明名称 METHOD FOR FABRICATING A PSEUDOMORPHIC HIGH ELECTRON MOBILITY TRANSISTOR
摘要 A method for manufacturing a pseudo morphic high electro mobility transistor is provided to improve the electric property and to increase breakdown voltage by forming a passivation layer having double recess structure. A cap layer(24) and a channel layer(22) are formed on a substrate(20). A source/drain(26) is formed on the cap layer. A first passivation layer(27) is formed, and then patterned to expose the cap layer in a channel region. A first recess structure is formed by removing the exposed cap layer. A second passivation layer is formed on the entire surface of the resultant structure. A second recess structure is formed by patterning the second passivation layer(29) to expose the substrate of the first recess structure. A multi-layered photosensitive film is formed, and then patterned to have an opening of gate shape and to expose the substrate through the second recess structure. A gate is formed to connect to the substrate through the second recess structure by removing the multi-layered photosensitive film, after depositing a metal on the resultant structure.
申请公布号 KR100631051(B1) 申请公布日期 2006.09.26
申请号 KR20050084755 申请日期 2005.09.12
申请人 ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 LIM, JONG WON;AHN, HO KYUN;JI, HONG GU;CHANG, WOO JIN;MUN, JAE KYOUNG;KIM, HEA CHEON
分类号 H01L29/778 主分类号 H01L29/778
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