发明名称 Atomic force microscope
摘要 An apparatus includes a sample stage, a cantilever mount, a cantilever-force detector, a cantilever feedback system, and a sample stage feedback system. The sample stage is configured for holding a sample. The cantilever mount is configured for mechanically fixing a mechanical cantilever having a scanning tip. The cantilever-force detector is configured to produce an electrical cantilever-force error signal. The cantilever feedback system is configured to electromechanically drive the mechanical cantilever in a manner responsive to the cantilever-force error signal. The sample stage feedback system is configured to electromechanically displace the sample stage in a manner responsive to the cantilever-force error signal. The cantilever feedback system and the sample stage feedback system are connected to receive the cantilever-force error signal in parallel.
申请公布号 US7111504(B2) 申请公布日期 2006.09.26
申请号 US20040954739 申请日期 2004.09.30
申请人 LUCENT TECHNOLOGIES INC. 发明人 BLUMBERG GIRSH;SCHLOCKERMANN CARL JOHANNES
分类号 G01B5/28;G01Q10/06 主分类号 G01B5/28
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