| 摘要 |
An apparatus for testing a material ( 2 ), having a measurement unit for measuring at least one electrical parameter of the material ( 2 ) to be tested, is proposed that ensures a measuring of all relevant parameters of the material ( 2 ) under identical measurement conditions. According to the present invention, this is achieved in that an optical measurement apparatus is provided for the simultaneous measurement of at least one optical parameter of the material ( 2 ) to be tested.
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