发明名称 Lithographic apparatus and device manufacturing method with feed-forward focus control
摘要 A lithographic apparatus includes an illumination system configured to provide a beam of radiation, a first support structure configured to support a patterning device, a second support that includes a substrate holder for holding a substrate, a projection system configured to project the patterned beam of radiation onto the substrate, and a servo unit configured to position the substrate holder. The apparatus further includes a sensor unit configured to determine a distance of at least one location point on the surface of the substrate relative to a reference plane, a memory unit configured to store surface information of the substrate based on respective distances of corresponding location points on the substrate surface, and a calculating unit configured to determine a feed-forward set-point signal based on the stored surface information, such that the feed-forward set-point signal is forwardly fed to the servo unit in order to position the substrate holder.
申请公布号 US7113256(B2) 申请公布日期 2006.09.26
申请号 US20040779866 申请日期 2004.02.18
申请人 ASML NETHERLANDS B.V. 发明人 BUTLER HANS;BOONMAN MARCUS EMILE JOANNES;VAN DEN BIGGELAAR PETRUS MARINUS CHRISTIANUS MARIA
分类号 G03B27/42;H01L21/027;G03F7/20;G03F9/00 主分类号 G03B27/42
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