发明名称 |
METHOD FOR FORMING ALIGNMENT KEY HAVING CAPPING LAYER AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE USING THE SAME |
摘要 |
<p>An alignment key forming method and a method for manufacturing a semiconductor device using the same are provided to simplify manufacturing processes by omitting an additional mask process using an alignment key with a stepped portion and a capping layer. An isolation layer(241) for defining an active region is formed within a chip region of a semiconductor substrate(200) and an alignment key(245) is formed within a scribe region(205). At this time, a stepped portion is formed between the alignment key and the substrate. A device forming layer is formed on the substrate. A device forming pattern(251) and a capping layer(255) for capping the alignment key are formed on the resultant structure by patterning selectively the device forming layer.</p> |
申请公布号 |
KR100630768(B1) |
申请公布日期 |
2006.09.26 |
申请号 |
KR20050089476 |
申请日期 |
2005.09.26 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, MYOUNG SOO |
分类号 |
H01L21/027;H01L21/76 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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