A transistor (1) has a FET (2) and a temperature sensing diode (4) integrated within it. Gate drive circuit (12) is arranged to switch off FET (2) and in this case biasing circuit (14) drives a constant current through the diode (4). The voltage across the diode (4) is measured by voltage sensor (15) which provides a measure of the temperature of the FET.
申请公布号
WO2006097896(A1)
申请公布日期
2006.09.21
申请号
WO2006IB50796
申请日期
2006.03.14
申请人
KONINKLIJKE PHILIPS ELECTRONICS N.V.;HEPPENSTALL, KEITH;BROWN, ADAM;KOH, ADRIAN;KENNEDY, IAN
发明人
HEPPENSTALL, KEITH;BROWN, ADAM;KOH, ADRIAN;KENNEDY, IAN