| 摘要 |
PROBLEM TO BE SOLVED: To provide a probe pin and IC socket that can accurately evaluate a measured IC and shorten the period of producing an evaluation board with electrical characteristics. SOLUTION: The probe pin 40 is incorporated into the IC socket interposed between the measured IC and the evaluation board with electrical characteristics, and has a capacitor 8 for reducing electric noise and a conductor section 6 connected with the capacitor 8. COPYRIGHT: (C)2006,JPO&NCIPI
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