发明名称 DEVICE AND METHOD FOR INSPECTING DEFECT OF FILM
摘要 PROBLEM TO BE SOLVED: To enable detection of even slight thickness non-uniformity and coating non-uniformity of an optical compensating film. SOLUTION: A light source section 15 is arranged on the lower face of the film 7 conveyed continuously, and the film 7 is irradiated with light. A photodetector 16 for receiving transmitted light from the film 7 is arranged so as to look down at the film 7, and the intersection angleθ1 between the optical axis P and a reference line (normal) Ln perpendicular to the film 7 is 30°≤θ1≤50°. The photodetector 16 is rotated about the reference line Ln by rotation angleθ2 with respect to a conveying direction S, and satisfies -60°≤θ2≤+60°. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006250715(A) 申请公布日期 2006.09.21
申请号 JP20050067747 申请日期 2005.03.10
申请人 FUJI PHOTO FILM CO LTD 发明人 NAKAJIMA TAKESHI;HIGUCHI MANABU;WAKITA TAKESHI
分类号 G01N21/892;G01B11/06;G01N21/89 主分类号 G01N21/892
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