发明名称 METHOD AND DEVICE FOR TREATING SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To improve the uniformity of an accuracy (a line width) on a treatment by suppressing the dispersion of the accuracy (the line width) on the treatment by shortening the coating time of a treatment liquid while enhancing a throughput, and to miniaturize a device. SOLUTION: In a method for treating a substrate, the square-shaped substrate to be treated G and a treatment-liquid supply means oppositely arranged to the substrate to be treated so as to coat the whole of one side of the substrate to be treated are displaced relatively in parallel, and the surface of the substrate to be treated is coated with a developer as the treatment liquid. In the method for treating the substrate, a pair of treatment-liquid supply nozzles 52a and 52b constituting the treatment-liquid supply means are arranged at the central section of the substrate to be treated, each treatment-liquid supply nozzle is moved to the opposed edges of the substrate to be treated respectively while supplying the developer from both treatment-liquid supply nozzles respectively and the developer is applied (a liquid swelling). COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006253515(A) 申请公布日期 2006.09.21
申请号 JP20050070228 申请日期 2005.03.14
申请人 TOKYO ELECTRON LTD 发明人 TANAKA YUKINOBU
分类号 H01L21/027;H01L21/304 主分类号 H01L21/027
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