发明名称 Test apparatus and method
摘要 An upper side and a lower side of a coupling member are provided with spiral contacts including elastic deforming portions. The elastic deforming portions are made contact with connectors of an IC package. Thereby, contact pressure on the IC package can be reduced. Further, the coupling member is replaceably positioned with respect to a substrate. Accordingly, only the coupling member can be replaced as needed, and therefore, maintenance fee can be reduced.
申请公布号 US2006211277(A1) 申请公布日期 2006.09.21
申请号 US20060378946 申请日期 2006.03.17
申请人 ALPS ELECTRIC CO., LTD. 发明人 SOETA KAORU
分类号 H01R12/00 主分类号 H01R12/00
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