发明名称 Apparatus for measuring photo diodes' temperature dependence
摘要 A system for measuring gains of a plurality of photo diodes includes a chamber adapted to host the plurality of photo diodes and a temperature control unit configured to control the temperature within the chamber to a predetermined temperature. A control unit selects at least one of the plurality of photo diodes. A hosting unit is configured to provide a bias voltage to the selected photo diode at the predetermined temperature. A light source transmits photo signals to the selected photo diode at the predetermined temperature. A measurement unit configured to measure current signals generated by the selected photo diode in response to the photo signals under the bias voltage at the predetermined temperature.
申请公布号 US2006208180(A1) 申请公布日期 2006.09.21
申请号 US20050082357 申请日期 2005.03.17
申请人 ZHANG CHAO;ZENG XUEFEI;YANG ZHONG;HUANG YUANJUN;JIANG ZHIYONG;CAO JUN 发明人 ZHANG CHAO;ZENG XUEFEI;YANG ZHONG;HUANG YUANJUN;JIANG ZHIYONG;CAO JUN
分类号 H01J7/24 主分类号 H01J7/24
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