发明名称 INSPECTION METHOD AND SYSTEM USING MULTIFREQUENCY PHASE ANALYSIS
摘要 PROBLEM TO BE SOLVED: To provide a multifrequency inspection technique for an eddy current under a surface capable of improving undersurface detection in an inside of an inspection objective component. SOLUTION: In this component inspection method, a plurality of multifrequency excitation signals is applied to a probe to generate a plurality of multifrequency response signals in the inspection objective component. Multifrequency phase analysis is executed in the multifrequency response signals to inspect an under side of the surface of the component. This inspection system includes the eddy current (EC) probe constituted to induce an eddy current in an inside of the component. The system is an eddy current measuring instrument coupled to the EC probe, and for applying the multifrequency response signals to the EC probe to generate the plurality of multifrequency response signals. The system includes further a processor constituted to analyze the multifrequency response signals from the eddy current measuring instrument by executing the multifrequency phase analysis, so as to inspect the under side of the surface of the component. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006250935(A) 申请公布日期 2006.09.21
申请号 JP20060060713 申请日期 2006.03.07
申请人 GENERAL ELECTRIC CO <GE> 发明人 WANG CHANGTING;MCKNIGHT WILLIAM STEWART;UI SUH;ERTEKIN SERKAN
分类号 G01B7/34 主分类号 G01B7/34
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