发明名称 Device for cleaning cvd device and method of cleaning cvd device
摘要 An apparatus for cleaning a CVD apparatus that can efficiently remove a by-product such as SiO<SUB>2 </SUB>or Si<SUB>3</SUB>N<SUB>4 </SUB>stuck and deposited onto the surface of an internal wall, an electrode, or the like in a reaction chamber in a film forming process, and a method for cleaning a CVD apparatus. A control monitors luminous intensity data of an F radical in a reaction chamber by optical emission spectroscopy and compares the data with calibrated prestored luminous intensity data, and ends cleaning after a predetermined time passes from reaching a luminous intensity saturation point. Furthermore, concentration data of SiF<SUB>4 </SUB>in a gas discharged from the reaction chamber are monitored by a Fourier transform infrared spectrometry and compared with prestored concentration data of SiF<SUB>4 </SUB>to decide that the predetermined time has passed when a predetermined cleaning end point concentration is reached, thereby ending the cleaning.
申请公布号 US2006207630(A1) 申请公布日期 2006.09.21
申请号 US20040548874 申请日期 2004.03.12
申请人 NATIONAL INST. OF ADV. INDUSTRIAL SCI. AND TECH 发明人 SAKAI KATSUO;ABE KAORU;OKURA SEIJI;SAKAMURA MASAJI;MURATA HITOSHI;KAMEDA KENJI;WANI ETSUO;SEKIYA AKIRA
分类号 B08B6/00;B05C11/00;B08B9/00;C23C16/00;C23C16/44;C23C16/52;C23F1/00;H01L21/31 主分类号 B08B6/00
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