METHOD FOR DARK CURRENT MEASUREMENT USING CBCM(CHARGE BASED CAPACITANCE MEASUREMENT)CIRCUIT FOR CMOS IMAGE SENSOR,申请号KR20050021719-传众专利搜索

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发明名称	METHOD FOR DARK CURRENT MEASUREMENT USING CBCM(CHARGE BASED CAPACITANCE MEASUREMENT)CIRCUIT FOR CMOS IMAGE SENSOR
摘要
申请公布号	KR20060100078(A)	申请公布日期	2006.09.20
申请号	KR20050021719	申请日期	2005.03.16
申请人	MAGNACHIP SEMICONDUCTOR, LTD.	发明人	CHOI, WOON IL
分类号	H01L27/146	主分类号	H01L27/146
代理机构		代理人
主权项
地址

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