| 摘要 |
Electronic testing devices such as multimeters, and probes therefor. The probes may have off-device display devices attached thereto. The display devices may be non-detachably attached to the probes. In an aspect, conductive pathways to carry probe signals and display signals may be run in parallel or be integrated and may be coupled with a common port or hole of the electronic testing device. In an aspect, a hinge may be used to attach the display devices to the probes. In an aspect, the display device may be attached to a side of the probe to facilitate viewing of the display by a user.
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