发明名称 Transporting tool for object to be tested, and object-to-be-tested transporting system
摘要 A transporting tool of this invention transports a cracked wafer between an unload table and a test position through fork, having a vacuum suction mechanism, and a main chuck. The transporting tool of this invention has a first groove formed in a first surface of the transporting tool, a first through hole which is formed to correspond to a first opening of the fork and is open to the first groove, a second groove formed in a second surface to correspond to an attracting groove of the main chuck, and a second through hole which allows the first groove and second groove to communicate with each other.
申请公布号 US7108471(B2) 申请公布日期 2006.09.19
申请号 US20040793188 申请日期 2004.03.05
申请人 TOKYO ELECTRON LIMITED 发明人 OSUGA YASUHIRO
分类号 B65G49/07;B65H5/00;H01L21/66;H01L21/677;H01L21/68;H01L21/683 主分类号 B65G49/07
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