发明名称 THERMAL VACUUM TEST DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a thermal vacuum test device capable of eliminating adverse temperature influence to a specimen panel by preventing temperature distribution of a shroud from becoming large. SOLUTION: Temperature-controllable heater blocks 6a-6d are installed on a part becoming a low temperature in a cooling shroud 4, i.e., a peripheral part of the cooling shroud at a temperature-rising step. Since temperature difference of a central part and the peripheral part is reduced in the cooling shroud by heating the installation place of the heater blocks 6a-6d, the temperature distribution of the cooling shroud 4 can be prevented from becoming large. Thereby, environment in which a peripheral temperature giving thermal influence to the specimen panel 2 is applied such that the temperature distribution of the specimen panel 2 is made uniform can be created. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006240587(A) 申请公布日期 2006.09.14
申请号 JP20050062580 申请日期 2005.03.07
申请人 MITSUBISHI ELECTRIC CORP 发明人 MURAKAMI MASAAKI;KANEZUKA NORIHIKO;OKUBO MITSURU;KAKITA KOJI
分类号 B64G7/00;G01M99/00 主分类号 B64G7/00
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