发明名称 SEMICONDUCTOR TEST DEVICE
摘要 PROBLEM TO BE SOLVED: To improve the generality of a device by constituting a proper hardware constitution for a plurality of devices to be measured in a semiconductor tester constituted by using a configurable device capable of configurating in programable, the hardware constitution such as FPGA. SOLUTION: The device comprises an FPGA 12 as a configurable device, an interface for configurating the FPGA 12, and a memory element 21 wherein a program defining the hardware constitution of the FPGA 12 is written, which is arranged exterior of the device body A and is connected via the interface. By changing the program configurating from the memory element 21 to the FPGA 12 to flexible, the device body A is operated in a hardware constitution proper for testing devices B to be measured. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006242638(A) 申请公布日期 2006.09.14
申请号 JP20050056332 申请日期 2005.03.01
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 KAMANO SATOSHI;KANEMITSU TOMOHIKO
分类号 G01R31/28;H03K19/173 主分类号 G01R31/28
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