发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To realize a semiconductor device in which resistivity of silicon in a source/drain region is sufficiently decreased to obtain performance as a transistor. SOLUTION: In a method of manufacturing a semiconductor device, a silicon integrated circuit is formed on a glass substrate. The method includes a step 14 of preparing a glass substrate; a step 22 of forming a silicon layer on the glass substrate; a step 42 of implanting ions into an active region of the silicon layer; a step 50 of covering the silicon layer by a heat pad material; a step 52 of activating ions in the silicon layer by annealing the glass substrate while keeping the substrate at a temperature of not more than the thermal equilibrium temperature; a step 54 of removing the heat pad material; and a step of completing the silicon integrated circuit. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2006245567(A) |
申请公布日期 |
2006.09.14 |
申请号 |
JP20060041574 |
申请日期 |
2006.02.17 |
申请人 |
SHARP CORP |
发明人 |
MAA JER-SHEN;SHIEN TEN SUU;LEE JONG-JAN;TWEET DOUGLAS J |
分类号 |
H01L21/265;H01L21/02;H01L21/336;H01L27/12;H01L29/786 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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