发明名称 Method of forming an ohmic contact in wide band semiconductor
摘要 A method of forming an ohmic contact on a substrate composed of a wide-band gap semiconductor material includes: depositing a transition metal group metal on the substrate; annealing the substrate at a high temperature to cause a solid state chemical reaction between the substrate and the deposited metal that forms a modified layer in the substrate having modified properties different than the substrate, and by-products composed of a silicide and a nanocrystalline graphite layer; selectively etching the substrate to remove one or more of the by-products of the solid state chemical reaction from a surface of the substrate; and depositing a metal film composed of a transition group metal over the modified layer on the substrate to form the ohmic contact. The modified layer permits formation of the ohmic contact without high temperature annealing after depositing the metal film.
申请公布号 US2006205195(A1) 申请公布日期 2006.09.14
申请号 US20050159264 申请日期 2005.06.23
申请人 THE UNIVERSITY OF NEWCASTLE UPON TYNE 发明人 MALHAN RAJESH K.;TAKEUCHI YUICHI;NIKITINA IRINA;VASSILEVSKI KONSTANTIN;WRIGHT NICHOLAS;HORSFALL ALTON
分类号 H01L21/28;H01L21/04;H01L29/417;H01L29/45;H01L29/739;H01L29/78 主分类号 H01L21/28
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