发明名称 Scalable integrated logic and non-volatile memory
摘要 A scalable, logic transistor has a pair of doped regions for the drain and source. A gate insulator layer is formed over the substrate and between the drain and source regions. A gate stack is formed of a gate layer, such as polysilicon or metal, between two metal nitride layers. A compatible non-volatile memory transistor can be formed from this basic structure by adding a high-K dielectric constant film with an embedded metal nano-dot layer between the tunnel insulator and the gate stack.
申请公布号 US2006205132(A1) 申请公布日期 2006.09.14
申请号 US20060430793 申请日期 2006.05.09
申请人 MICRON TECHNOLOGY, INC. 发明人 BHATTACHARYYA ARUP
分类号 H01L21/8234 主分类号 H01L21/8234
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