发明名称 Method for forming SiC-based film and method for fabricating semiconductor device
摘要 The method for forming an SiC-based film comprises the step of generating NH<SUB>3 </SUB>plasma on the surface of a substrate 20 in a chamber to make NH<SUB>3 </SUB>plasma processing on the substrate 20 , the step of removing reaction products containing nitrogen remaining in the chamber, and the step of forming an SiC film 34 on the substrate 20 by PECVD.
申请公布号 US2006205193(A1) 申请公布日期 2006.09.14
申请号 US20050220591 申请日期 2005.09.08
申请人 FUJITSU LIMITED 发明人 SUGIMOTO KEN;OHKURA YOSHIYUKI;WATATANI HIROFUMI;OWADA TAMOTSU;INOUE KENGO
分类号 H01L21/26;H01L21/42 主分类号 H01L21/26
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