发明名称 PICK AND PLACE MACHINE WITH IMPROVED COMPONENT PICK UP INSPECTION
摘要 Embodiments of the present invention improve upon component level inspection performed by pick and place machines (10, 201). Such improvements include inspecting the pick operation in pick and place machines (10, 201) by collecting images of the pick event inside the machine (10, 201) and identifying errors as they happen. By detecting and displaying this information as it generated on the machine, the operator or machine can take prompt and effective corrective actions.
申请公布号 WO2006042014(A3) 申请公布日期 2006.09.14
申请号 WO2005US35985 申请日期 2005.10.05
申请人 CYBEROPTICS CORPORATION;CASE, STEVEN, K.;HAUGEN, PAUL, R.;DUQUETTE, DAVID, W.;MADSEN, DAVID, D.;FISHBAINE, DAVID;FISHER, LANCE, K.;MANICKAM, SWAMINATHAN;BADAR, TIMOTHY, G. 发明人 CASE, STEVEN, K.;HAUGEN, PAUL, R.;DUQUETTE, DAVID, W.;MADSEN, DAVID, D.;FISHBAINE, DAVID;FISHER, LANCE, K.;MANICKAM, SWAMINATHAN;BADAR, TIMOTHY, G.
分类号 H05K13/08;H05K13/04 主分类号 H05K13/08
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