Nano-patterning method using Atomic Force Microscope based on Voltage Programming,申请号KR20040045942-传众专利搜索

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发明名称	Nano-patterning method using Atomic Force Microscope based on Voltage Programming
摘要
申请公布号	KR100621790(B1)	申请公布日期	2006.09.14
申请号	KR20040045942	申请日期	2004.06.21
申请人		发明人
分类号	B82B3/00;G01Q60/24	主分类号	B82B3/00
代理机构		代理人
主权项
地址

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