| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a scattering correcting method for correcting the effect of scattering when a subject is photographed by the multi-slicing tomography, a scattering measuring method for measuring the quantity of scattering, and an X-ray CT apparatus. <P>SOLUTION: The length of projection pro_ex of other objects 40-42 than the subject, which are objects to generate scattering, is found, and the length of projection pro_pt of the subject of photographyαis found. Then, data I (do, do) are measured by photographing the subject of photographyαwith the beam thickness equivalent to the detector thickness do, and data I (do, d) are measured by photographing the subject of photographyαwith the beam thickness d thicker than the detector thickness do. Then, the quantity of scattering S(do, d) is computed based on the difference between the data I (do, do) and the data I (do, d), and stored as correlated to the sum of the length of projection, "pro_pt+pro_ex". After photographing the subject and collecting data, the length of projection pro_pt of the subject is found and the length of projection pro_ex of the corresponding other object than the subject is found. Then, the quantity of scattering S(do, d) corresponding to the sum of the length of projection pro_pt and the length of projection pro_ex is read, and the data are corrected with scattering. As a result, deterioration of the quality of the CT image caused by the scattering can be inhibited. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p> |
