发明名称 Semiconductor device with STI and its manufacture
摘要 A semiconductor device includes: a silicon substrate with semiconductor elements; an isolation trench formed in the silicon substrate for isolating active regions in the silicon substrate, the isolation trench having a trapezoidal cross sectional shape having a width gradually narrowing with a depth from the surface of the silicon substrate; a first liner insulating film formed on the surface of the trench and made of a silicon oxide film or a silicon oxynitride film having a thickness of 1 to 5 nm; a second liner insulating film formed on the first liner insulating film and made of a silicon nitride film having a thickness of 2 to 8 nm; and an isolation region burying the trench defined by the second liner insulating film.
申请公布号 US2006202301(A1) 申请公布日期 2006.09.14
申请号 US20060433671 申请日期 2006.05.15
申请人 FUJITSU LIMITED 发明人 OHTA HIROYUKI;IRIYAMA YASUNORI
分类号 H01L21/76;H01L29/00;H01L21/762;H01L21/8234;H01L27/08 主分类号 H01L21/76
代理机构 代理人
主权项
地址