发明名称 Manufacturing inspection/analysis system analyzing device, analyzing device control program, storage medium storing analyzing device control program, and method for manufacturing inspection and analysis
摘要 A position change section of a processing device changes the position of a treatment object, at the time of performing a process by a process section, to correspond to a predetermined position in conformity to the treatment object. An inspection device inspects the occurrence of a defect on the treatment object having been subjected to processes by a plurality of processing devices. Then an analyzing process for specifying in which processing device the defect occurred is carried out based on (i) positional information of the treatment object, in each of the processing devices, and (ii) defect information defected by the inspection device. With this arrangement, during the process of manufacture of treatment objects, it is possible to precisely specify which processing device or processing device group caused the defect, without performing processes such as attaching, to the treatment object, information regarding processing devices which have conducted processes.
申请公布号 US2006203230(A1) 申请公布日期 2006.09.14
申请号 US20060369934 申请日期 2006.03.08
申请人 SHARP KABUSHIKI KAISHA 发明人 OHMINAMI NOBUYUKI;TANAKA MASARU;UMEMOTO TAKESHI
分类号 G01N21/88 主分类号 G01N21/88
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