发明名称 Method and apparatus for detecting abnormal characteristic values capable of suppressing detection of normal characteristic values
摘要 In a method for detecting abnormal characteristic values of a plurality of products sequentially manufactured in the same manufacturing line, it is determined whether or not a successive-decrease (or increase) tendency has occurred in a plurality of sequentially-obtained characteristic values of the products. Also, it is determined whether or not at least a last one of the characteristic values is located within a control region narrower than an allowable region and outside a normal region narrower than the control region. Further, when the successive-decrease tendency has occurred and the last characteristic value is located within the control region outside the normal region, an alarm state is detected.
申请公布号 US2006206230(A1) 申请公布日期 2006.09.14
申请号 US20060372031 申请日期 2006.03.10
申请人 NEC ELECTRONICS CORPORATION 发明人 HIGASHIDE MASANOBU
分类号 G06F19/00;G05B19/418;G05B23/02 主分类号 G06F19/00
代理机构 代理人
主权项
地址
您可能感兴趣的专利