发明名称 Method of fabricating a non-volatile memory element
摘要 An interpoly insulating film is modified in the film quality, while preventing generation of trap sites. A floating gate 101 is provided on a channel-forming region in the vicinity of the surface of a silicon substrate 112, an interpoly insulating film 134 is provided so as to contact with the floating gate 101, and a control gate 103 is provided so as to contact with the interpoly insulating film 134 and so as to be opposed to at least a part of the floating gate 101. A process step of providing the interpoly insulating film 134 further includes a step of forming on the floating gate 101, the interpoly insulating film 134 so as to contact with the floating gate 101, and a step of exposing, subsequently to the formation of the interpoly insulating film 134 , the interpoly insulating film 134 to an atmosphere containing a nitrogen-containing gas and oxygen, to thereby simultaneously proceed nitriding and oxidation of the interpoly insulating film 134.
申请公布号 US2006205155(A1) 申请公布日期 2006.09.14
申请号 US20060368635 申请日期 2006.03.07
申请人 NEC ELECTRONICS CORPORATION 发明人 MAKABE MARIKO;HASEGAWA EIJI
分类号 H01L21/336 主分类号 H01L21/336
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