发明名称 MULTILAYER WIRING STRUCTURE, SEMICONDUCTOR DEVICE, PATTERN TRANSFER MASK AND METHOD FOR MANUFACTURING MULTILAYER WIRING STRUCTURE
摘要 <p>A multilayer wiring structure is provided with a plurality of wirings at a fine pitch, and is applicable to a case wherein a via is connected to at least one wiring. In the multilayer wiring structure, a region facing the via is locally narrowed, in at least the wiring which faces the via, among the wirings adjacent to the wiring to which the via is connected.</p>
申请公布号 WO2006095915(A1) 申请公布日期 2006.09.14
申请号 WO2006JP305178 申请日期 2006.03.09
申请人 NEC CORPORATION;OOTAKE, HIROTO;HAYASHI, YOSHIHIRO 发明人 OOTAKE, HIROTO;HAYASHI, YOSHIHIRO
分类号 H01L21/768;H01L21/3205;H01L21/82;H01L23/52 主分类号 H01L21/768
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