摘要 |
<p>Processing method involves generating, analyzing and optimizing of check routine by information used automatically on allocation of many contact points (P1,P2,P3). Components (L,D,ML) of electric circuit are attached to one or more contact points so that a summarized performance test of all attached points is possible with electric contact of one or more contact points. An independent claim is also included for a processing device for check routine.</p> |