| 摘要 |
<P>PROBLEM TO BE SOLVED: To realize testing easily by suppressing increment of circuit elements about a test function to the minimum in a semiconductor apparatus especially including a phase transition material. <P>SOLUTION: When a retention test or the like of the phase change element P1 are performed, for example, originally, voltage applied to the phase change element P1 is made generation voltage VS1 of a bit line voltage power source VG_set for set provided for performing set operation of the phase change element P1, timing at which voltage VS1 is applied to the phase change element P1 is generated by a timing generation circuit TG_rd_test at the time of read-out/test originally provided for performing read-out operation of the phase change element P1. Thereby, increment of circuit elements is suppressed, the retention test accelerated with a voltage base can be performed easily. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
