摘要 |
A device made through a fabrication method is disclosed. In one embodiment, the method includes a dry etch plasma process that utilizes CO<SUB>2 </SUB>to etch a layer. Furthermore, the dry etch plasma process may utilize CO<SUB>2 </SUB>in combination with NH<SUB>3</SUB>, H<SUB>2</SUB>, Ar, N<SUB>2</SUB>, He, or other inert gases during the etching process. In another embodiment, the CO<SUB>2 </SUB>dry etch plasma process etches an anti-reflectant coating layer while enabling greater selectivity and control with regard to underlying layers.
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